Pascal and Francis Bibliographic Databases

Help

Search results

Your search

kw.\*:("Mesure épaisseur")

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Language

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Origin

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 1397

  • Page / 56
Export

Selection :

  • and

Contribution of scattering effects in the inspection of coating on substrates with variable thickness = Der Beitrag von Streueffekten bei der Untersuchung von Beschichtungen unterschiedlicher DickeSIDULENKO, O.A.The Soviet journal of nondestructive testing. 1984, Vol 20, Num 7, pp 439-444, issn 0038-5492Article

COMMENT DÉTERMINER L'INEXACTITUDE DE MESURE EN MESURAGE DE L'ÉPAISSEUR PAR ULTRASONS ?CHAUVEAU, Daniel; BLETTNER, Alexis.Soudage et techniques connexes. 2013, Vol 67, Num 9-10, pp 42-45, issn 0246-0963, 4 p.Article

Measurement of thickness or plate velocity using ambient vibrationsING, Ros K; ETAIX, Nicolas; LEBLANC, Alexandre et al.The Journal of the Acoustical Society of America. 2010, Vol 127, Num 6, issn 0001-4966, EL252-EL257Article

Investigations to calibrate reference standards for the thickness of coatingsAHBE, T; HASCHE, K; HERRMANN, K et al.Fresenius' journal of analytical chemistry. 1999, Vol 365, Num 1-3, pp 55-58, issn 0937-0633Conference Paper

An optical measuring method of high temperature clinker layer's thicknessCHENGBO ZHENG; BIN LIU; ZUOJUN WANG et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 60240UY.1-60240U.6, issn 0277-786X, isbn 0-8194-6055-9, 1VolConference Paper

Thickness and roughness measurements in poly(o-methoxyaniline) layer-by-layer films using AFMRAPOSO, M; LOBO, R. F. M; PEREIRA-DA-SILVA, M. A et al.International symposium on electrets. 1999, pp 533-536, isbn 0-7803-5025-1Conference Paper

Thickness UTELDER, James B; VANDE KAMP, Rodney W.Materials evaluation. 2011, Vol 69, Num 11, pp 1269-1276, issn 0025-5327, 8 p.Article

Relation between photoacoustic signal and sample thicknessGUIFEN WANG; YONGMAO CHANG; GENYUAN MA et al.Journal of applied physics. 1993, Vol 73, Num 11, pp 7275-7279, issn 0021-8979, 1Article

Les mesures d'épaisseurs : Contrôle et mesureBOOMS, Alexandre.Traitements & matériaux. 2010, Vol 402, pp 21-25, issn 2108-2804, 5 p.Article

Results and Repeatability of Retinal Thickness Measurements From Certification SubmissionsDANIS, Ronald P; FISHER, Marian R; LAMBERT, Ericka et al.Archives of ophthalmology (1960). 2008, Vol 126, Num 1, pp 45-50, issn 0003-9950, 6 p.Article

Dickenmessung an Walzerzeugnissen = Thickness measurement at rolled productsAluminium (Düsseldorf). 1984, Vol 60, Num 8, pp 574-575, issn 0002-6689Article

Using chromatic confocal apparatus for in-situ rolling thickness measurement in hot embossing processCHEN, Yi-Chang; DONG, Shu-Ping; WANG, Chun-Chieh et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7767, issn 0277-786X, isbn 978-0-8194-8263-1, 1Vol, 77670P.1-77670P.7Conference Paper

In Vivo Human Choroidal Thickness Measurements : Evidence for Diurnal FluctuationsBROWN, Jamin S; FLITCROFT, D. Ian; YING, Gui-Shuang et al.Investigative ophthalmology & visual science. 2009, Vol 50, Num 1, pp 5-12, issn 0146-0404, 8 p.Article

Comparative Study of Central Corneal Thickness Measurement with Slit-Lamp Optical Coherence Tomography and Visante Optical Coherence TomographyHAITAO LI; LEUNG, Christopher Kai Shun; WONG, Lee et al.Ophthalmology (Rochester, MN). 2008, Vol 115, Num 5, pp 798-803, issn 0161-6420, 6 p.Article

Intraobserver and interobserver reproducibility in the evaluation of ultrasonic pachymetry measurements of central corneal thicknessMIGLIOR, S; ALBE, E; GUARESCHI, M et al.British journal of ophthalmology. 2004, Vol 88, Num 2, pp 174-177, issn 0007-1161, 4 p.Article

Effect of contact lens wear on central corneal thickness measurementsBRAUN, Dennis A; ANDERSON PENNO, Ellen E.Journal of cataract and refractive surgery. 2003, Vol 29, Num 7, pp 1319-1322, issn 0886-3350, 4 p.Article

Calculations of secondary magnetic fields with a view to measuring thicknesses of nonmagnetic coatingsKREMEN'KOVA, N. V; LUK'YANOV, A. L; LUKHVICH, A. A et al.Russian journal of nondestructive testing. 2001, Vol 37, Num 9, pp 609-614, issn 1061-8309Article

Magnetic flux sensor for control of thick steel platesKANG, B. K; KIM, S. D; LEE, J. S et al.Sensors and actuators. A, Physical. 1998, Vol 65, Num 2-3, pp 203-208, issn 0924-4247Article

Surface roughness effects in quantitative XPS : magic angle for determining overlayer thicknessGUNTER, P. L. J; GIJZEMAN, O. L. J; NIEMANTSVERDRIET, J. W et al.Applied surface science. 1997, Vol 115, Num 4, pp 342-346, issn 0169-4332Article

A simple profilometer for film thickness measurementWOOD, J. W; REDIN, R. D.Review of scientific instruments. 1993, Vol 64, Num 8, pp 2405-2406, issn 0034-6748Article

A piezoelectric range sensor for thickness measurements in refractory materialsFIORILLO, A. S; LAMBERTI, N; PAPPALARDO, M et al.Sensors and actuators. A, Physical. 1993, Vol 37-38, pp 381-384, issn 0924-4247Conference Paper

Dort messen, wo das Handelsübliche an Grenzen stösst = Measurements at the limits of commercial instrumentsNEUMAIER, P.Metalloberfläche. 1992, Vol 46, Num 6, pp 275-279, issn 0026-0797Article

Probleme der Schichtdickenmessung : Besonderheiten bei der Bewertung von Korrosionsschutzsystemen = Problems with measuring layer thicknesses. Peculiarities when evaluating corrosion protection systemsVAN OETEREN, K. A.Metalloberfläche. 1991, Vol 45, Num 2, pp 71-72, issn 0026-0797, 2 p.Article

System for measuring the thickness of strip on the four-stand rolling mill 1700SHERSHELYUK, V.P; RYNNOV, N.I; EGOROV, I.V et al.Metallurg. 1985, Vol 7, pp 33-35, issn 0026-0827Article

Pruefvorrichtung zur roentgenografisch-diffraktometrischen Schichtdickenmessung von industriellen Bauteilen = A device for radiographic-diffractometric layer thickness measurement of industrial componentsNICKEL, J; KAEMPFE, B; MAY, E et al.Feingerätetechnik. 1985, Vol 34, Num 7, pp 304-306, issn 0014-9683Article

  • Page / 56